TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_58_03
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-015-016-10 | FUSED_ID : 6359364768413839626
  IC_TEMP :  -61.06 | VDDM : 1110.31 | AUX_INT :   -9.16 | CsaBias :   80.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35741e-03 / 2
  ADC_P0  : -9.15949e-03 ± 2.49216e-02
  ADC_P1  : 8.17429e-03 ± 5.83863e-04
  ADC_P2  : -6.14121e-06 ± 2.70976e-06
  CSA_Chi2/NDF : 9.03402e-05 / 2
  CSA_P0  : 5.87864e-02 ± 6.33961e-03
  CSA_P1  : 9.31330e-03 ± 4.77644e-04
  CSA_P2  : -4.05862e-05 ± 7.27396e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [7]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1244', '1.800', '0.1583', '1.800', '0.0842', '7.000', '0.7075', 1, 1, 1, 1, 1728338283.3358283]
VI_after__Init : ['1.202', '0.1244', '1.800', '0.1583', '1.800', '0.0792', '7.000', '0.7073', 1, 1, 1, 1, 1728338291.3672462]
VI_at__the_End : ['1.202', '0.4816', '1.800', '0.1380', '1.801', '0.1150', '7.000', '0.7082', 1, 1, 1, 1, 1728338359.4411242]