TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_54_46
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-015-018-10 | FUSED_ID : 6359364768413839658
  IC_TEMP :  -66.97 | VDDM : 1097.29 | AUX_INT :   -9.96 | CsaBias :   71.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63012e-03 / 2
  ADC_P0  : -9.96279e-03 ± 2.73305e-02
  ADC_P1  : 8.24817e-03 ± 6.42444e-04
  ADC_P2  : -6.33965e-06 ± 2.99484e-06
  CSA_Chi2/NDF : 1.51012e-04 / 2
  CSA_P0  : 5.88665e-02 ± 8.19648e-03
  CSA_P1  : 9.54823e-03 ± 6.17546e-04
  CSA_P2  : -4.62599e-05 ± 9.40449e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [11, 65, 84, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [19, 69]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2324', '1.800', '0.1273', '1.800', '0.0919', '7.000', '0.7072', 1, 1, 1, 1, 1728338086.138736]
VI_after__Init : ['1.201', '0.2336', '1.800', '0.1271', '1.800', '0.0873', '7.000', '0.7073', 1, 1, 1, 1, 1728338094.2991076]
VI_at__the_End : ['1.201', '0.4730', '1.800', '0.1363', '1.802', '0.1143', '7.000', '0.7077', 1, 1, 1, 1, 1728338162.3659031]