TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_53_08
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-015-019-10 | FUSED_ID : 6359364768413839674
  IC_TEMP :  -62.71 | VDDM : 1080.89 | AUX_INT :   -9.92 | CsaBias :   68.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.79994e-03 / 2
  ADC_P0  : -9.91669e-03 ± 2.88467e-02
  ADC_P1  : 7.90199e-03 ± 6.76080e-04
  ADC_P2  : -4.49073e-06 ± 3.16515e-06
  CSA_Chi2/NDF : 1.70041e-04 / 2
  CSA_P0  : 6.10172e-02 ± 8.69759e-03
  CSA_P1  : 1.07637e-02 ± 6.55301e-04
  CSA_P2  : -6.61998e-05 ± 9.97945e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [0, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [5, 82]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3641', '1.800', '0.1568', '1.799', '0.0914', '7.000', '0.7072', 1, 1, 1, 1, 1728337987.7500703]
VI_after__Init : ['1.202', '0.3643', '1.800', '0.1568', '1.802', '0.0859', '6.999', '0.7072', 1, 1, 1, 1, 1728337995.9144301]
VI_at__the_End : ['1.201', '0.4713', '1.800', '0.1371', '1.805', '0.1187', '6.999', '0.7079', 1, 1, 1, 1, 1728338063.878328]