TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_48_12
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-015-022-10 | FUSED_ID : 6359364768413839722
  IC_TEMP :  -54.89 | VDDM : 1112.68 | AUX_INT :   -7.93 | CsaBias :   78.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04575e-03 / 2
  ADC_P0  : -7.93343e-03 ± 2.18676e-02
  ADC_P1  : 7.92338e-03 ± 5.03347e-04
  ADC_P2  : -5.50618e-06 ± 2.29212e-06
  CSA_Chi2/NDF : 1.04979e-04 / 2
  CSA_P0  : 5.84199e-02 ± 6.83398e-03
  CSA_P1  : 9.42452e-03 ± 5.14891e-04
  CSA_P2  : -3.99310e-05 ± 7.84118e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [52]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2598', '1.800', '0.1720', '1.800', '0.0861', '7.000', '0.7071', 1, 1, 1, 1, 1728337691.8042796]
VI_after__Init : ['1.202', '0.2598', '1.800', '0.1720', '1.799', '0.0804', '7.000', '0.7070', 1, 1, 1, 1, 1728337700.0266576]
VI_at__the_End : ['1.201', '0.4917', '1.800', '0.1363', '1.805', '0.1115', '7.000', '0.7078', 1, 1, 1, 1, 1728337767.3186665]