TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_46_33
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-015-023-10 | FUSED_ID : 6359364768413839738
  IC_TEMP :  -56.32 | VDDM : 1125.24 | AUX_INT :   -8.87 | CsaBias :   72.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49877e-03 / 2
  ADC_P0  : -8.86823e-03 ± 2.62447e-02
  ADC_P1  : 8.16163e-03 ± 6.23325e-04
  ADC_P2  : -5.71612e-06 ± 2.93201e-06
  CSA_Chi2/NDF : 8.83123e-05 / 2
  CSA_P0  : 5.88341e-02 ± 6.26806e-03
  CSA_P1  : 9.63051e-03 ± 4.72253e-04
  CSA_P2  : -4.07284e-05 ± 7.19185e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [2]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2929', '1.800', '0.1815', '1.799', '0.0901', '7.000', '0.7069', 1, 1, 1, 1, 1728337593.1106136]
VI_after__Init : ['1.202', '0.2928', '1.800', '0.1815', '1.801', '0.0851', '7.000', '0.7073', 1, 1, 1, 1, 1728337601.3389864]
VI_at__the_End : ['1.201', '0.4997', '1.800', '0.1393', '1.804', '0.1121', '7.000', '0.7079', 1, 1, 1, 1, 1728337668.850888]