TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_43_16
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-015-025-10 | FUSED_ID : 6359364768413839770
  IC_TEMP :  -63.40 | VDDM : 1122.57 | AUX_INT :  -27.24 | CsaBias :   83.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75839e-03 / 2
  ADC_P0  : -2.72440e-02 ± 2.94077e-02
  ADC_P1  : 8.62660e-03 ± 7.01353e-04
  ADC_P2  : -7.26447e-06 ± 3.30539e-06
  CSA_Chi2/NDF : 9.06562e-05 / 2
  CSA_P0  : 5.84949e-02 ± 6.35069e-03
  CSA_P1  : 9.23163e-03 ± 4.78479e-04
  CSA_P2  : -3.76015e-05 ± 7.28667e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [77, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [16, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3948', '1.800', '0.1255', '1.799', '0.0929', '7.000', '0.7073', 1, 1, 1, 1, 1728337395.833213]
VI_after__Init : ['1.201', '0.3942', '1.800', '0.1255', '1.801', '0.0872', '7.005', '0.7069', 1, 1, 1, 1, 1728337404.002632]
VI_at__the_End : ['1.202', '0.4875', '1.800', '0.1357', '1.802', '0.1139', '7.004', '0.7081', 1, 1, 1, 1, 1728337471.6136065]