TEST_NAME : Wafer
TEST_DATE : 24_10_08-00_20_53
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-016-007-05 | FUSED_ID : 6359364768413843573
  IC_TEMP :  -60.11 | VDDM : 1119.45 | AUX_INT :  -10.14 | CsaBias :   66.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.88359e-03 / 2
  ADC_P0  : -1.01441e-02 ± 2.94519e-02
  ADC_P1  : 8.56673e-03 ± 7.29517e-04
  ADC_P2  : -6.31297e-06 ± 3.59088e-06
  CSA_Chi2/NDF : 1.48083e-04 / 2
  CSA_P0  : 5.98796e-02 ± 8.11661e-03
  CSA_P1  : 1.01165e-02 ± 6.11528e-04
  CSA_P2  : -4.94936e-05 ± 9.31285e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [40]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3138', '1.800', '0.1605', '1.800', '0.0925', '7.000', '0.7078', 1, 1, 1, 1, 1728339653.3371985]
VI_after__Init : ['1.202', '0.3138', '1.800', '0.1599', '1.799', '0.0877', '7.000', '0.7077', 1, 1, 1, 1, 1728339661.3686142]
VI_at__the_End : ['1.200', '0.4991', '1.800', '0.1378', '1.806', '0.1142', '7.000', '0.7084', 1, 1, 1, 1, 1728339722.4007688]