TEST_NAME : Wafer
TEST_DATE : 24_10_08-00_37_19
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-016-017-02 | FUSED_ID : 6359364768413843730
  IC_TEMP :  -58.48 | VDDM : 1114.56 | AUX_INT :   -8.41 | CsaBias :   81.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22380e-03 / 2
  ADC_P0  : -8.41483e-03 ± 2.36956e-02
  ADC_P1  : 8.26656e-03 ± 5.71057e-04
  ADC_P2  : -5.78014e-06 ± 2.72959e-06
  CSA_Chi2/NDF : 1.16983e-04 / 2
  CSA_P0  : 5.92234e-02 ± 7.21411e-03
  CSA_P1  : 9.76009e-03 ± 5.43531e-04
  CSA_P2  : -4.45481e-05 ± 8.27734e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [51, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3837', '1.800', '0.1867', '1.800', '0.0964', '7.000', '0.7077', 1, 1, 1, 1, 1728340639.7527206]
VI_after__Init : ['1.202', '0.3838', '1.800', '0.1861', '1.801', '0.0908', '7.000', '0.7078', 1, 1, 1, 1, 1728340647.7951307]
VI_at__the_End : ['1.202', '0.4926', '1.800', '0.1380', '1.801', '0.1132', '7.000', '0.7085', 1, 1, 1, 1, 1728340715.5018575]