TEST_NAME : Wafer
TEST_DATE : 24_10_08-00_45_32
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-016-022-02 | FUSED_ID : 6359364768413843810
  IC_TEMP :  -56.54 | VDDM : 1121.87 | AUX_INT :   -7.82 | CsaBias :   83.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13915e-03 / 2
  ADC_P0  : -7.81738e-03 ± 2.28576e-02
  ADC_P1  : 7.64967e-03 ± 5.13149e-04
  ADC_P2  : -4.86723e-06 ± 2.28045e-06
  CSA_Chi2/NDF : 5.76513e-05 / 2
  CSA_P0  : 5.87618e-02 ± 5.06439e-03
  CSA_P1  : 8.72371e-03 ± 3.81565e-04
  CSA_P2  : -3.02103e-05 ± 5.81079e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.0297', '1.800', '0.1507', '1.800', '0.0766', '7.000', '0.7079', 1, 1, 1, 1, 1728341131.7176645]
VI_after__Init : ['1.202', '0.0297', '1.800', '0.1506', '1.799', '0.0712', '7.000', '0.7079', 1, 1, 1, 1, 1728341140.5010476]
VI_at__the_End : ['1.201', '0.4865', '1.800', '0.1349', '1.800', '0.1128', '7.000', '0.7086', 1, 1, 1, 1, 1728341207.8312023]