TEST_NAME : Wafer
TEST_DATE : 24_10_08-00_47_10
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-016-023-02 | FUSED_ID : 6359364768413843826
  IC_TEMP :  -57.51 | VDDM : 1118.69 | AUX_INT :   -8.52 | CsaBias :   94.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22531e-03 / 2
  ADC_P0  : -8.52130e-03 ± 2.36877e-02
  ADC_P1  : 7.99927e-03 ± 5.47009e-04
  ADC_P2  : -5.72264e-06 ± 2.50177e-06
  CSA_Chi2/NDF : 8.22887e-05 / 2
  CSA_P0  : 5.75234e-02 ± 6.05052e-03
  CSA_P1  : 9.22504e-03 ± 4.55863e-04
  CSA_P2  : -3.43438e-05 ± 6.94225e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [39]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3564', '1.800', '0.1711', '1.800', '0.0981', '7.000', '0.7088', 1, 1, 1, 1, 1728341230.756535]
VI_after__Init : ['1.202', '0.3564', '1.800', '0.1712', '1.800', '0.0908', '7.000', '0.7079', 1, 1, 1, 1, 1728341238.8339295]
VI_at__the_End : ['1.201', '0.4991', '1.800', '0.1376', '1.801', '0.1115', '7.000', '0.7087', 1, 1, 1, 1, 1728341298.0737023]