TEST_NAME : Wafer
TEST_DATE : 24_10_08-01_08_33
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-017-010-08 | FUSED_ID : 6359364768413847720
  IC_TEMP :  -59.96 | VDDM : 1112.10 | AUX_INT :   -9.31 | CsaBias :   86.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48127e-03 / 2
  ADC_P0  : -9.31387e-03 ± 2.60633e-02
  ADC_P1  : 8.07041e-03 ± 6.03844e-04
  ADC_P2  : -5.90845e-06 ± 2.77377e-06
  CSA_Chi2/NDF : 1.20881e-04 / 2
  CSA_P0  : 5.71132e-02 ± 7.33335e-03
  CSA_P1  : 9.64775e-03 ± 5.52515e-04
  CSA_P2  : -4.33811e-05 ± 8.41414e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [60, 83]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1009', '1.800', '0.1373', '1.800', '0.0775', '7.000', '0.7081', 1, 1, 1, 1, 1728342512.8524466]
VI_after__Init : ['1.201', '0.1010', '1.800', '0.1377', '1.800', '0.0726', '7.000', '0.7080', 1, 1, 1, 1, 1728342521.0308282]
VI_at__the_End : ['1.201', '0.4861', '1.800', '0.1384', '1.800', '0.1135', '7.000', '0.7087', 1, 1, 1, 1, 1728342589.0967274]