TEST_NAME : Wafer
TEST_DATE : 24_10_08-01_06_54
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-017-011-08 | FUSED_ID : 6359364768413847736
  IC_TEMP :  -64.10 | VDDM : 1114.62 | AUX_INT :   -9.56 | CsaBias :   71.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53699e-03 / 2
  ADC_P0  : -9.56164e-03 ± 2.65656e-02
  ADC_P1  : 8.19316e-03 ± 6.29615e-04
  ADC_P2  : -5.80039e-06 ± 2.96422e-06
  CSA_Chi2/NDF : 1.60357e-04 / 2
  CSA_P0  : 5.92898e-02 ± 8.44630e-03
  CSA_P1  : 1.00354e-02 ± 6.36368e-04
  CSA_P2  : -5.06117e-05 ± 9.69113e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [3, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3410', '1.800', '0.1363', '1.800', '0.0952', '7.000', '0.7081', 1, 1, 1, 1, 1728342414.7527628]
VI_after__Init : ['1.201', '0.3409', '1.800', '0.1362', '1.800', '0.0894', '7.000', '0.7081', 1, 1, 1, 1, 1728342422.9002132]
VI_at__the_End : ['1.202', '0.4862', '1.800', '0.1387', '1.800', '0.1163', '7.000', '0.7089', 1, 1, 1, 1, 1728342489.3441467]