TEST_NAME : Wafer
TEST_DATE : 24_10_08-01_05_15
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-017-012-08 | FUSED_ID : 6359364768413847752
  IC_TEMP :  -59.24 | VDDM : 1109.28 | AUX_INT :   -7.72 | CsaBias :   88.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85276e-04 / 2
  ADC_P0  : -7.72024e-03 ± 2.12388e-02
  ADC_P1  : 8.05166e-03 ± 5.00050e-04
  ADC_P2  : -5.45292e-06 ± 2.33334e-06
  CSA_Chi2/NDF : 1.52825e-04 / 2
  CSA_P0  : 5.88063e-02 ± 8.24556e-03
  CSA_P1  : 1.02078e-02 ± 6.21244e-04
  CSA_P2  : -4.76323e-05 ± 9.46080e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [54, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [87]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4903', '1.800', '0.1401', '1.800', '0.0917', '7.000', '0.7082', 1, 1, 1, 1, 1728342315.579298]
VI_after__Init : ['1.202', '0.4909', '1.800', '0.1402', '1.800', '0.0861', '7.000', '0.7080', 1, 1, 1, 1, 1728342323.7976701]
VI_at__the_End : ['1.201', '0.5084', '1.800', '0.1422', '1.809', '0.1128', '7.000', '0.7088', 1, 1, 1, 1, 1728342391.7365131]