TEST_NAME : Wafer
TEST_DATE : 24_10_08-01_03_36
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-017-013-08 | FUSED_ID : 6359364768413847768
  IC_TEMP :  -58.80 | VDDM : 1119.44 | AUX_INT :   -8.18 | CsaBias :   73.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18578e-03 / 2
  ADC_P0  : -8.18148e-03 ± 2.33490e-02
  ADC_P1  : 8.19964e-03 ± 5.67529e-04
  ADC_P2  : -5.13880e-06 ± 2.74034e-06
  CSA_Chi2/NDF : 1.45357e-04 / 2
  CSA_P0  : 5.71993e-02 ± 8.04155e-03
  CSA_P1  : 1.00691e-02 ± 6.05873e-04
  CSA_P2  : -4.83224e-05 ± 9.22673e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1667', '1.800', '0.1718', '1.800', '0.0837', '7.000', '0.7088', 1, 1, 1, 1, 1728342216.1047676]
VI_after__Init : ['1.202', '0.1668', '1.800', '0.1718', '1.799', '0.0760', '7.000', '0.7079', 1, 1, 1, 1, 1728342224.8470228]
VI_at__the_End : ['1.202', '0.4958', '1.800', '0.1392', '1.800', '0.1147', '7.000', '0.7088', 1, 1, 1, 1, 1728342292.5350258]