TEST_NAME : Wafer
TEST_DATE : 24_10_08-01_00_20
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-017-015-08 | FUSED_ID : 6359364768413847800
  IC_TEMP :  -59.18 | VDDM : 1117.07 | AUX_INT :   -9.05 | CsaBias :   82.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51588e-03 / 2
  ADC_P0  : -9.05106e-03 ± 2.64373e-02
  ADC_P1  : 7.71559e-03 ± 6.03865e-04
  ADC_P2  : -4.47874e-06 ± 2.74664e-06
  CSA_Chi2/NDF : 1.40863e-04 / 2
  CSA_P0  : 5.84671e-02 ± 7.91628e-03
  CSA_P1  : 9.84399e-03 ± 5.96435e-04
  CSA_P2  : -4.58533e-05 ± 9.08300e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1957', '1.800', '0.1264', '1.800', '0.0853', '7.000', '0.7080', 1, 1, 1, 1, 1728342019.4985244]
VI_after__Init : ['1.202', '0.1957', '1.800', '0.1263', '1.800', '0.0796', '7.000', '0.7079', 1, 1, 1, 1, 1728342028.3418958]
VI_at__the_End : ['1.198', '0.4866', '1.800', '0.1375', '1.800', '0.1125', '7.000', '0.7086', 1, 1, 1, 1, 1728342095.061799]