TEST_NAME : Wafer
TEST_DATE : 24_10_08-00_58_41
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-017-016-15 | FUSED_ID : 6359364768413847823
  IC_TEMP :  -57.79 | VDDM : 1124.97 | AUX_INT :   -7.57 | CsaBias :   86.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08370e-03 / 2
  ADC_P0  : -7.56822e-03 ± 2.23154e-02
  ADC_P1  : 7.90197e-03 ± 5.22204e-04
  ADC_P2  : -4.89996e-06 ± 2.42226e-06
  CSA_Chi2/NDF : 1.13468e-04 / 2
  CSA_P0  : 5.81474e-02 ± 7.10493e-03
  CSA_P1  : 9.53117e-03 ± 5.35305e-04
  CSA_P2  : -4.09365e-05 ± 8.15206e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [21]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3732', '1.800', '0.1390', '1.800', '0.0934', '7.000', '0.7081', 1, 1, 1, 1, 1728341921.3878255]
VI_after__Init : ['1.202', '0.3732', '1.800', '0.1390', '1.800', '0.0877', '7.000', '0.7079', 1, 1, 1, 1, 1728341929.473253]
VI_at__the_End : ['1.192', '0.4941', '1.800', '0.1380', '1.815', '0.1124', '7.000', '0.7088', 1, 1, 1, 1, 1728341995.9021983]