TEST_NAME : Wafer
TEST_DATE : 24_10_08-00_57_02
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-017-017-15 | FUSED_ID : 6359364768413847839
  IC_TEMP :  -61.23 | VDDM : 1121.27 | AUX_INT :  -10.34 | CsaBias :   71.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73693e-03 / 2
  ADC_P0  : -1.03431e-02 ± 2.82781e-02
  ADC_P1  : 8.24378e-03 ± 6.76648e-04
  ADC_P2  : -5.53999e-06 ± 3.23512e-06
  CSA_Chi2/NDF : 1.70281e-04 / 2
  CSA_P0  : 5.82748e-02 ± 8.70373e-03
  CSA_P1  : 1.05370e-02 ± 6.55764e-04
  CSA_P2  : -5.41725e-05 ± 9.98650e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [70]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [2]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.5067', '1.800', '0.1467', '1.800', '0.1010', '7.000', '0.7089', 1, 1, 1, 1, 1728341822.766173]
VI_after__Init : ['1.202', '0.5074', '1.800', '0.1469', '1.800', '0.0936', '7.000', '0.7079', 1, 1, 1, 1, 1728341830.75854]
VI_at__the_End : ['1.202', '0.5011', '1.800', '0.1393', '1.800', '0.1142', '7.000', '0.7087', 1, 1, 1, 1, 1728341896.3347266]