TEST_NAME : Wafer
TEST_DATE : 24_10_08-00_52_06
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-017-020-15 | FUSED_ID : 6359364768413847887
  IC_TEMP :  -56.70 | VDDM : 1128.12 | AUX_INT :  -35.78 | CsaBias :   61.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.23691e-03 / 2
  ADC_P0  : -3.57782e-02 ± 3.36717e-02
  ADC_P1  : 8.16617e-03 ± 7.43592e-04
  ADC_P2  : -6.74068e-06 ± 3.24739e-06
  CSA_Chi2/NDF : 9.42084e-05 / 2
  CSA_P0  : 5.81706e-02 ± 6.47392e-03
  CSA_P1  : 9.16811e-03 ± 4.87763e-04
  CSA_P2  : -3.49638e-05 ± 7.42805e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [24, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [35, 74]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1993', '1.800', '0.1658', '1.800', '0.0828', '7.000', '0.7079', 1, 1, 1, 1, 1728341525.8602026]
VI_after__Init : ['1.202', '0.1993', '1.800', '0.1658', '1.800', '0.0774', '7.000', '0.7079', 1, 1, 1, 1, 1728341534.5165167]
VI_at__the_End : ['1.202', '0.4956', '1.800', '0.1349', '1.801', '0.1124', '7.000', '0.7086', 1, 1, 1, 1, 1728341593.5461988]