TEST_NAME : Wafer
TEST_DATE : 24_10_08-00_50_27
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-017-021-15 | FUSED_ID : 6359364768413847903
  IC_TEMP :  -64.43 | VDDM : 1125.01 | AUX_INT :   -7.62 | CsaBias :   82.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20280e-03 / 2
  ADC_P0  : -7.62021e-03 ± 2.35018e-02
  ADC_P1  : 8.23023e-03 ± 5.67586e-04
  ADC_P2  : -5.68512e-06 ± 2.71048e-06
  CSA_Chi2/NDF : 1.19512e-04 / 2
  CSA_P0  : 5.86490e-02 ± 7.29170e-03
  CSA_P1  : 9.88072e-03 ± 5.49377e-04
  CSA_P2  : -4.39931e-05 ± 8.36636e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [80]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3579', '1.800', '0.1554', '1.800', '0.0904', '7.000', '0.7081', 1, 1, 1, 1, 1728341426.905463]
VI_after__Init : ['1.201', '0.3579', '1.800', '0.1556', '1.799', '0.0853', '7.000', '0.7078', 1, 1, 1, 1, 1728341435.036838]
VI_at__the_End : ['1.202', '0.5028', '1.800', '0.1387', '1.800', '0.1162', '7.000', '0.7085', 1, 1, 1, 1, 1728341503.748906]