TEST_NAME : Wafer
TEST_DATE : 24_10_08-00_48_48
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-017-022-15 | FUSED_ID : 6359364768413847919
  IC_TEMP :  -67.77 | VDDM : 1118.20 | AUX_INT :   -8.77 | CsaBias :   83.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41134e-03 / 2
  ADC_P0  : -8.76529e-03 ± 2.54204e-02
  ADC_P1  : 8.47938e-03 ± 6.18025e-04
  ADC_P2  : -6.72850e-06 ± 2.96675e-06
  CSA_Chi2/NDF : 1.27147e-04 / 2
  CSA_P0  : 5.79390e-02 ± 7.52101e-03
  CSA_P1  : 9.56325e-03 ± 5.66654e-04
  CSA_P2  : -4.08119e-05 ± 8.62947e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1285', '1.800', '0.1423', '1.800', '0.0857', '7.000', '0.7087', 1, 1, 1, 1, 1728341328.067571]
VI_after__Init : ['1.202', '0.1286', '1.800', '0.1422', '1.800', '0.0790', '7.000', '0.7079', 1, 1, 1, 1, 1728341337.0578632]
VI_at__the_End : ['1.201', '0.4945', '1.800', '0.1366', '1.800', '0.1164', '7.000', '0.7088', 1, 1, 1, 1, 1728341398.3774283]