TEST_NAME : Wafer
TEST_DATE : 24_10_08-01_16_45
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-018-010-06 | FUSED_ID : 6359364768413851814
  IC_TEMP :  -52.33 | VDDM : 1116.63 | AUX_INT :   -8.22 | CsaBias :   90.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31864e-03 / 2
  ADC_P0  : -8.21851e-03 ± 2.45859e-02
  ADC_P1  : 8.28433e-03 ± 5.91226e-04
  ADC_P2  : -5.81602e-06 ± 2.82846e-06
  CSA_Chi2/NDF : 1.23390e-04 / 2
  CSA_P0  : 5.77649e-02 ± 7.40903e-03
  CSA_P1  : 9.70257e-03 ± 5.58217e-04
  CSA_P2  : -3.99223e-05 ± 8.50099e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [6]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [58, 71]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2089', '1.800', '0.1383', '1.800', '0.0904', '7.000', '0.7081', 1, 1, 1, 1, 1728343005.110696]
VI_after__Init : ['1.202', '0.2089', '1.800', '0.1383', '1.800', '0.0848', '7.000', '0.7079', 1, 1, 1, 1, 1728343013.9069605]
VI_at__the_End : ['1.201', '0.5066', '1.800', '0.1404', '1.800', '0.1100', '7.000', '0.7086', 1, 1, 1, 1, 1728343073.3357208]