TEST_NAME : Wafer
TEST_DATE : 24_10_08-01_20_02
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-018-012-06 | FUSED_ID : 6359364768413851846
  IC_TEMP :  -56.10 | VDDM : 1121.90 | AUX_INT :  -70.99 | CsaBias :   35.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16946e-03 / 2
  ADC_P0  : -7.09889e-02 ± 2.61688e-02
  ADC_P1  : 8.93701e-03 ± 6.02467e-04
  ADC_P2  : -8.27118e-06 ± 2.73300e-06
  CSA_Chi2/NDF : 1.22106e-04 / 2
  CSA_P0  : 5.79913e-02 ± 7.37038e-03
  CSA_P1  : 9.49412e-03 ± 5.55305e-04
  CSA_P2  : -3.89676e-05 ± 8.45664e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [92, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [23, 56]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2649', '1.800', '0.1645', '1.800', '0.0878', '7.000', '0.7082', 1, 1, 1, 1, 1728343202.549889]
VI_after__Init : ['1.202', '0.2650', '1.800', '0.1645', '1.800', '0.0825', '7.000', '0.7078', 1, 1, 1, 1, 1728343210.8232992]
VI_at__the_End : ['1.202', '0.4976', '1.800', '0.1364', '1.800', '0.1132', '7.000', '0.7090', 1, 1, 1, 1, 1728343278.1346507]