TEST_NAME : Wafer
TEST_DATE : 24_10_08-01_23_19
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-018-014-06 | FUSED_ID : 6359364768413851878
  IC_TEMP :  -68.76 | VDDM : 1114.35 | AUX_INT :   -8.63 | CsaBias :   65.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27791e-03 / 2
  ADC_P0  : -8.62605e-03 ± 2.42138e-02
  ADC_P1  : 8.26083e-03 ± 5.83545e-04
  ADC_P2  : -5.74224e-06 ± 2.78928e-06
  CSA_Chi2/NDF : 1.94616e-04 / 2
  CSA_P0  : 5.91087e-02 ± 9.30489e-03
  CSA_P1  : 1.01650e-02 ± 7.01056e-04
  CSA_P2  : -5.56041e-05 ± 1.06763e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [43, 87]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3547', '1.800', '0.1552', '1.799', '0.0886', '7.000', '0.7080', 1, 1, 1, 1, 1728343398.824831]
VI_after__Init : ['1.202', '0.3536', '1.800', '0.1549', '1.801', '0.0829', '7.000', '0.7079', 1, 1, 1, 1, 1728343406.9101126]
VI_at__the_End : ['1.202', '0.4742', '1.800', '0.1391', '1.802', '0.1167', '7.000', '0.7088', 1, 1, 1, 1, 1728343475.6276104]