TEST_NAME : Wafer
TEST_DATE : 24_10_08-01_24_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-018-015-06 | FUSED_ID : 6359364768413851894
  IC_TEMP :  -57.90 | VDDM : 1135.79 | AUX_INT : -174.91 | CsaBias :  -54.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.70959e-04 / 2
  ADC_P0  : -1.74914e-01 ± 2.19825e-02
  ADC_P1  : 1.02255e-02 ± 4.75691e-04
  ADC_P2  : -1.29468e-05 ± 2.02000e-06
  CSA_Chi2/NDF : 1.11188e-04 / 2
  CSA_P0  : 5.91075e-02 ± 7.03318e-03
  CSA_P1  : 9.73128e-03 ± 5.29900e-04
  CSA_P2  : -4.13891e-05 ± 8.06974e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2396', '1.800', '0.1301', '1.800', '0.0918', '7.000', '0.7080', 1, 1, 1, 1, 1728343497.1856835]
VI_after__Init : ['1.202', '0.2396', '1.800', '0.1290', '1.801', '0.0863', '7.000', '0.7080', 1, 1, 1, 1, 1728343505.3381836]
VI_at__the_End : ['1.202', '0.5043', '1.800', '0.1378', '1.801', '0.1124', '7.000', '0.7089', 1, 1, 1, 1, 1728343568.308055]