TEST_NAME : Wafer
TEST_DATE : 24_10_08-01_26_36
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-018-016-01 | FUSED_ID : 6359364768413851905
  IC_TEMP :  -53.68 | VDDM : 1121.91 | AUX_INT :   -7.58 | CsaBias :   85.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10417e-03 / 2
  ADC_P0  : -7.58445e-03 ± 2.25112e-02
  ADC_P1  : 7.78558e-03 ± 5.15073e-04
  ADC_P2  : -5.02073e-06 ± 2.33193e-06
  CSA_Chi2/NDF : 7.11616e-05 / 2
  CSA_P0  : 5.97560e-02 ± 5.62659e-03
  CSA_P1  : 9.29427e-03 ± 4.23923e-04
  CSA_P2  : -3.56108e-05 ± 6.45584e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [11, 70]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [121, 122, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1446', '1.800', '0.1276', '1.800', '0.0836', '7.000', '0.7082', 1, 1, 1, 1, 1728343595.509935]
VI_after__Init : ['1.202', '0.1446', '1.800', '0.1278', '1.800', '0.0780', '7.000', '0.7080', 1, 1, 1, 1, 1728343604.3552732]
VI_at__the_End : ['1.202', '0.5011', '1.800', '0.1372', '1.802', '0.1108', '7.000', '0.7088', 1, 1, 1, 1, 1728343670.3238976]