TEST_NAME : Wafer
TEST_DATE : 24_10_10-14_43_02
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-005-021-09 | FUSED_ID : 6359364768416944473
  IC_TEMP :  -67.78 | VDDM : 1129.17 | AUX_INT :   -8.23 | CsaBias :   76.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09595e-03 / 2
  ADC_P0  : -8.22826e-03 ± 2.24120e-02
  ADC_P1  : 8.51267e-03 ± 5.59698e-04
  ADC_P2  : -5.90023e-06 ± 2.77514e-06
  CSA_Chi2/NDF : 2.28258e-04 / 2
  CSA_P0  : 5.67763e-02 ± 1.00771e-02
  CSA_P1  : 1.07318e-02 ± 7.59236e-04
  CSA_P2  : -6.08544e-05 ± 1.15623e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [11, 73]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3472', '1.800', '0.1555', '1.800', '0.0961', '7.000', '0.7081', 1, 1, 1, 1, 1728564182.5266156]
VI_after__Init : ['1.202', '0.3471', '1.800', '0.1557', '1.799', '0.0920', '7.000', '0.7079', 1, 1, 1, 1, 1728564190.6350498]
VI_at__the_End : ['1.202', '0.4887', '1.800', '0.1402', '1.807', '0.1180', '7.000', '0.7087', 1, 1, 1, 1, 1728564250.5209308]