TEST_NAME : Wafer
TEST_DATE : 24_10_10-18_49_53
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-011-021-00 | FUSED_ID : 6359364768416969040
  IC_TEMP :  -55.19 | VDDM : 1123.18 | AUX_INT :   -8.34 | CsaBias :   80.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11323e-03 / 2
  ADC_P0  : -8.34468e-03 ± 2.25524e-02
  ADC_P1  : 8.10105e-03 ± 5.26618e-04
  ADC_P2  : -5.94627e-06 ± 2.43336e-06
  CSA_Chi2/NDF : 1.30352e-04 / 2
  CSA_P0  : 5.78160e-02 ± 7.61521e-03
  CSA_P1  : 9.77147e-03 ± 5.73751e-04
  CSA_P2  : -4.46767e-05 ± 8.73755e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2759', '1.800', '0.1582', '1.799', '0.0906', '7.000', '0.7071', 1, 1, 1, 1, 1728578993.0294588]
VI_after__Init : ['1.202', '0.2760', '1.800', '0.1582', '1.800', '0.0853', '7.000', '0.7070', 1, 1, 1, 1, 1728579001.1718557]
VI_at__the_End : ['1.201', '0.4939', '1.800', '0.1376', '1.803', '0.1125', '7.000', '0.7077', 1, 1, 1, 1, 1728579067.2520232]