TEST_NAME : Wafer
TEST_DATE : 24_10_10-19_58_59
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-012-024-08 | FUSED_ID : 6359364768416973192
  IC_TEMP :  -65.16 | VDDM : 1120.87 | AUX_INT :   -8.68 | CsaBias :   59.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39445e-03 / 2
  ADC_P0  : -8.68476e-03 ± 2.52842e-02
  ADC_P1  : 8.61690e-03 ± 6.29520e-04
  ADC_P2  : -6.65410e-06 ± 3.10068e-06
  CSA_Chi2/NDF : 1.66115e-04 / 2
  CSA_P0  : 6.06173e-02 ± 8.59660e-03
  CSA_P1  : 1.00485e-02 ± 6.47692e-04
  CSA_P2  : -4.93970e-05 ± 9.86358e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3366', '1.800', '0.1369', '1.799', '0.0968', '7.000', '0.7079', 1, 1, 1, 1, 1728583139.4887788]
VI_after__Init : ['1.201', '0.3367', '1.800', '0.1370', '1.799', '0.0922', '7.000', '0.7081', 1, 1, 1, 1, 1728583147.6630557]
VI_at__the_End : ['1.201', '0.4935', '1.800', '0.1409', '1.800', '0.1150', '7.000', '0.7085', 1, 1, 1, 1, 1728583213.4409442]