TEST_NAME : Wafer
TEST_DATE : 24_10_10-22_38_30
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-017-017-03 | FUSED_ID : 6359364768416993555
  IC_TEMP :  -50.64 | VDDM : 1127.56 | AUX_INT :   -6.75 | CsaBias :   83.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09214e-03 / 2
  ADC_P0  : -6.74581e-03 ± 2.23788e-02
  ADC_P1  : 8.30780e-03 ± 5.47966e-04
  ADC_P2  : -5.84358e-06 ± 2.64248e-06
  CSA_Chi2/NDF : 7.63007e-05 / 2
  CSA_P0  : 5.90983e-02 ± 5.82622e-03
  CSA_P1  : 9.32304e-03 ± 4.38963e-04
  CSA_P2  : -3.69066e-05 ± 6.68489e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [44]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3928', '1.800', '0.1477', '1.800', '0.0908', '7.000', '0.7082', 1, 1, 1, 1, 1728592709.970191]
VI_after__Init : ['1.202', '0.3929', '1.800', '0.1474', '1.799', '0.0858', '7.000', '0.7082', 1, 1, 1, 1, 1728592717.9526045]
VI_at__the_End : ['1.202', '0.4976', '1.799', '0.1394', '1.804', '0.1093', '7.000', '0.7088', 1, 1, 1, 1, 1728592786.1923988]