TEST_NAME : Wafer
TEST_DATE : 24_10_10-23_13_07
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-018-019-13 | FUSED_ID : 6359364768416997693
  IC_TEMP :  -54.20 | VDDM : 1124.77 | AUX_INT :   -7.78 | CsaBias :   78.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13414e-03 / 2
  ADC_P0  : -7.77738e-03 ± 2.28288e-02
  ADC_P1  : 7.89627e-03 ± 5.34216e-04
  ADC_P2  : -4.86367e-06 ± 2.47798e-06
  CSA_Chi2/NDF : 1.17327e-04 / 2
  CSA_P0  : 6.21538e-02 ± 7.22472e-03
  CSA_P1  : 1.00772e-02 ± 5.44331e-04
  CSA_P2  : -4.36981e-05 ± 8.28951e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [70]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4681', '1.800', '0.1516', '1.800', '0.0934', '7.000', '0.7080', 1, 1, 1, 1, 1728594787.5583885]
VI_after__Init : ['1.202', '0.4679', '1.800', '0.1514', '1.799', '0.0880', '7.000', '0.7080', 1, 1, 1, 1, 1728594795.861705]
VI_at__the_End : ['1.202', '0.5197', '1.800', '0.1405', '1.804', '0.1100', '7.000', '0.7087', 1, 1, 1, 1, 1728594864.3086004]