TEST_NAME : Wafer
TEST_DATE : 24_10_11-13_29_36
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-003-016-04 | FUSED_ID : 6359364768417984772
  IC_TEMP :  -82.11 | VDDM : 1112.65 | AUX_INT :  -10.50 | CsaBias :   61.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.65415e-03 / 2
  ADC_P0  : -1.05016e-02 ± 2.75005e-02
  ADC_P1  : 9.09082e-03 ± 7.04865e-04
  ADC_P2  : -7.97997e-06 ± 3.58727e-06
  CSA_Chi2/NDF : 2.07586e-04 / 2
  CSA_P0  : 5.78139e-02 ± 9.60996e-03
  CSA_P1  : 1.02717e-02 ± 7.24041e-04
  CSA_P2  : -6.11776e-05 ± 1.10263e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3180', '1.800', '0.1443', '1.800', '0.0979', '7.000', '0.7072', 1, 1, 1, 1, 1728646176.5670633]
VI_after__Init : ['1.202', '0.3183', '1.800', '0.1444', '1.800', '0.0936', '7.000', '0.7072', 1, 1, 1, 1, 1728646184.650381]
VI_at__the_End : ['1.202', '0.4572', '1.800', '0.1330', '1.800', '0.1242', '7.000', '0.7078', 1, 1, 1, 1, 1728646244.3320098]