TEST_NAME : Wafer
TEST_DATE : 24_10_11-15_39_36
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-007-021-02 | FUSED_ID : 6359364768418001234
  IC_TEMP :  -63.70 | VDDM : 1133.46 | AUX_INT :   -6.73 | CsaBias :   60.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.71981e-04 / 2
  ADC_P0  : -6.73430e-03 ± 2.10604e-02
  ADC_P1  : 8.48997e-03 ± 5.17892e-04
  ADC_P2  : -6.50437e-06 ± 2.51542e-06
  CSA_Chi2/NDF : 1.51817e-04 / 2
  CSA_P0  : 5.77038e-02 ± 8.21830e-03
  CSA_P1  : 9.61278e-03 ± 6.19190e-04
  CSA_P2  : -4.54985e-05 ± 9.42953e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [71]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [37, 85]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4546', '1.800', '0.1572', '1.800', '0.0996', '7.000', '0.7069', 1, 1, 1, 1, 1728653976.154309]
VI_after__Init : ['1.201', '0.4557', '1.800', '0.1582', '1.800', '0.0940', '7.000', '0.7070', 1, 1, 1, 1, 1728653984.9366162]
VI_at__the_End : ['1.202', '0.4792', '1.800', '0.1359', '1.800', '0.1196', '7.000', '0.7078', 1, 1, 1, 1, 1728654044.4330435]