TEST_NAME : Wafer
TEST_DATE : 24_10_11-16_17_32
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-008-006-01 | FUSED_ID : 6359364768418005089
  IC_TEMP :  -59.21 | VDDM : 1115.51 | AUX_INT :   -7.08 | CsaBias :   75.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85580e-04 / 2
  ADC_P0  : -7.07991e-03 ± 2.12720e-02
  ADC_P1  : 8.28134e-03 ± 5.24271e-04
  ADC_P2  : -5.31624e-06 ± 2.55660e-06
  CSA_Chi2/NDF : 1.69684e-04 / 2
  CSA_P0  : 5.75038e-02 ± 8.68847e-03
  CSA_P1  : 1.00543e-02 ± 6.54614e-04
  CSA_P2  : -4.97497e-05 ± 9.96899e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [71]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3264', '1.800', '0.1708', '1.800', '0.0987', '7.000', '0.7087', 1, 1, 1, 1, 1728656251.8845832]
VI_after__Init : ['1.202', '0.3266', '1.800', '0.1710', '1.800', '0.0925', '7.000', '0.7079', 1, 1, 1, 1, 1728656259.823881]
VI_at__the_End : ['1.202', '0.4872', '1.800', '0.1394', '1.799', '0.1134', '7.000', '0.7086', 1, 1, 1, 1, 1728656323.707048]