TEST_NAME : Wafer
TEST_DATE : 24_10_11-16_29_04
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-008-013-01 | FUSED_ID : 6359364768418005201
  IC_TEMP :  -64.83 | VDDM : 1123.20 | AUX_INT :   -8.36 | CsaBias :   75.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32238e-03 / 2
  ADC_P0  : -8.35842e-03 ± 2.46325e-02
  ADC_P1  : 8.42144e-03 ± 6.03953e-04
  ADC_P2  : -6.14360e-06 ± 2.92877e-06
  CSA_Chi2/NDF : 1.48620e-04 / 2
  CSA_P0  : 5.75113e-02 ± 8.13131e-03
  CSA_P1  : 9.82875e-03 ± 6.12636e-04
  CSA_P2  : -4.95470e-05 ± 9.32972e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2134', '1.800', '0.1642', '1.800', '0.0893', '7.000', '0.7076', 1, 1, 1, 1, 1728656943.6392186]
VI_after__Init : ['1.202', '0.2135', '1.800', '0.1644', '1.800', '0.0847', '7.000', '0.7077', 1, 1, 1, 1, 1728656951.818569]
VI_at__the_End : ['1.201', '0.4760', '1.800', '0.1357', '1.801', '0.1193', '7.000', '0.7084', 1, 1, 1, 1, 1728657019.0325706]