TEST_NAME : Wafer
TEST_DATE : 24_10_11-18_08_01
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-010-021-05 | FUSED_ID : 6359364768418013525
  IC_TEMP :  -67.87 | VDDM : 1114.32 | AUX_INT :  -10.68 | CsaBias :   74.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.89137e-03 / 2
  ADC_P0  : -1.06754e-02 ± 2.94993e-02
  ADC_P1  : 8.58433e-03 ± 7.29063e-04
  ADC_P2  : -6.33528e-06 ± 3.59186e-06
  CSA_Chi2/NDF : 1.80350e-04 / 2
  CSA_P0  : 5.72664e-02 ± 8.95737e-03
  CSA_P1  : 1.02268e-02 ± 6.74873e-04
  CSA_P2  : -5.45611e-05 ± 1.02775e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [31, 68]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [32, 45, 63]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1614', '1.800', '0.1481', '1.799', '0.0930', '7.000', '0.7074', 1, 1, 1, 1, 1728662880.6807418]
VI_after__Init : ['1.202', '0.1615', '1.800', '0.1481', '1.800', '0.0862', '7.000', '0.7068', 1, 1, 1, 1, 1728662889.3969288]
VI_at__the_End : ['1.201', '0.4788', '1.800', '0.1363', '1.803', '0.1213', '7.000', '0.7075', 1, 1, 1, 1, 1728662948.4547434]