TEST_NAME : Wafer
TEST_DATE : 24_10_11-19_50_18
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-013-023-13 | FUSED_ID : 6359364768418025853
  IC_TEMP :  -62.92 | VDDM : 1103.65 | AUX_INT :   -7.27 | CsaBias :   65.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.86428e-04 / 2
  ADC_P0  : -7.26633e-03 ± 2.01155e-02
  ADC_P1  : 8.16214e-03 ± 4.77522e-04
  ADC_P2  : -5.89057e-06 ± 2.23960e-06
  CSA_Chi2/NDF : 1.86307e-04 / 2
  CSA_P0  : 5.78746e-02 ± 9.10409e-03
  CSA_P1  : 9.97169e-03 ± 6.85927e-04
  CSA_P2  : -4.96322e-05 ± 1.04459e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [6, 48, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3009', '1.800', '0.1373', '1.800', '0.0952', '7.000', '0.7079', 1, 1, 1, 1, 1728669018.5063725]
VI_after__Init : ['1.202', '0.3012', '1.800', '0.1373', '1.800', '0.0900', '7.000', '0.7076', 1, 1, 1, 1, 1728669026.5297866]
VI_at__the_End : ['1.201', '0.4875', '1.800', '0.1354', '1.799', '0.1168', '7.000', '0.7084', 1, 1, 1, 1, 1728669095.2927427]