TEST_NAME : Wafer
TEST_DATE : 24_10_11-22_41_40
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-043-018-012-02 | FUSED_ID : 6359364768418046146
  IC_TEMP :  -59.59 | VDDM : 1125.29 | AUX_INT :  -41.77 | CsaBias :   56.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60899e-03 / 2
  ADC_P0  : -4.17659e-02 ± 2.90915e-02
  ADC_P1  : 8.30013e-03 ± 6.58950e-04
  ADC_P2  : -6.52992e-06 ± 2.94996e-06
  CSA_Chi2/NDF : 1.38210e-04 / 2
  CSA_P0  : 5.68482e-02 ± 7.84138e-03
  CSA_P1  : 9.59052e-03 ± 5.90792e-04
  CSA_P2  : -4.21334e-05 ± 8.99706e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [66]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3110', '1.800', '0.1109', '1.800', '0.0953', '7.000', '0.7089', 1, 1, 1, 1, 1728679300.7683642]
VI_after__Init : ['1.202', '0.3114', '1.800', '0.1110', '1.800', '0.0880', '7.000', '0.7080', 1, 1, 1, 1, 1728679308.8169332]
VI_at__the_End : ['1.202', '0.4897', '1.800', '0.1331', '1.800', '0.1155', '7.000', '0.7086', 1, 1, 1, 1, 1728679373.269917]