TEST_NAME : Wafer
TEST_DATE : 24_12_10-09_45_40
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-005-012-06 | FUSED_ID : 6359364768457838790
  IC_TEMP :  -73.98 | VDDM : 1121.44 | AUX_INT :  -12.11 | CsaBias :   50.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.22955e-03 / 2
  ADC_P0  : -1.21069e-02 ± 3.20130e-02
  ADC_P1  : 9.02088e-03 ± 8.18859e-04
  ADC_P2  : -7.31096e-06 ± 4.18893e-06
  CSA_Chi2/NDF : 1.61363e-04 / 2
  CSA_P0  : 6.03594e-02 ± 8.47274e-03
  CSA_P1  : 1.04728e-02 ± 6.38360e-04
  CSA_P2  : -6.50030e-05 ± 9.72146e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [39]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3172', '1.800', '0.1607', '1.800', '0.0933', '7.000', '0.7069', 1, 1, 1, 1, 1733820339.9653146]
VI_after__Init : ['1.202', '0.3183', '1.800', '0.1611', '1.800', '0.0873', '7.000', '0.7069', 1, 1, 1, 1, 1733820348.8625948]
VI_at__the_End : ['1.201', '0.4587', '1.800', '0.1371', '1.800', '0.1146', '7.000', '0.7075', 1, 1, 1, 1, 1733820414.1317654]