TEST_NAME : Wafer
TEST_DATE : 24_12_10-13_13_00
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-010-014-02 | FUSED_ID : 6359364768457859298
  IC_TEMP :  -66.11 | VDDM : 1125.42 | AUX_INT :   -8.20 | CsaBias :   61.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33100e-03 / 2
  ADC_P0  : -8.20377e-03 ± 2.47383e-02
  ADC_P1  : 8.71965e-03 ± 6.34692e-04
  ADC_P2  : -6.21763e-06 ± 3.22541e-06
  CSA_Chi2/NDF : 1.69191e-04 / 2
  CSA_P0  : 5.83350e-02 ± 8.67583e-03
  CSA_P1  : 9.96165e-03 ± 6.53662e-04
  CSA_P2  : -5.52731e-05 ± 9.95449e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [34, 86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [82]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2900', '1.800', '0.1472', '1.800', '0.0912', '7.000', '0.7070', 1, 1, 1, 1, 1733832779.5355513]
VI_after__Init : ['1.201', '0.2903', '1.800', '0.1474', '1.800', '0.0840', '7.000', '0.7069', 1, 1, 1, 1, 1733832788.4308672]
VI_at__the_End : ['1.197', '0.4643', '1.800', '0.1342', '1.800', '0.1110', '7.000', '0.7073', 1, 1, 1, 1, 1733832850.4651432]