TEST_NAME : Wafer
TEST_DATE : 24_12_10-13_49_06
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-011-020-08 | FUSED_ID : 6359364768457863496
  IC_TEMP :  -67.56 | VDDM : 1121.53 | AUX_INT :   -9.02 | CsaBias :   60.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25502e-03 / 2
  ADC_P0  : -9.02009e-03 ± 2.39463e-02
  ADC_P1  : 8.77826e-03 ± 6.02013e-04
  ADC_P2  : -7.08724e-06 ± 3.00084e-06
  CSA_Chi2/NDF : 1.83507e-04 / 2
  CSA_P0  : 6.05129e-02 ± 9.03544e-03
  CSA_P1  : 1.03350e-02 ± 6.80755e-04
  CSA_P2  : -5.99270e-05 ± 1.03671e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [34]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3396', '1.800', '0.1475', '1.800', '0.0941', '7.000', '0.7065', 1, 1, 1, 1, 1733834946.21]
VI_after__Init : ['1.201', '0.3402', '1.800', '0.1477', '1.801', '0.0885', '7.000', '0.7064', 1, 1, 1, 1, 1733834954.2103853]
VI_at__the_End : ['1.201', '0.4697', '1.800', '0.1368', '1.800', '0.1123', '7.000', '0.7070', 1, 1, 1, 1, 1733835014.5037796]