TEST_NAME : Wafer
TEST_DATE : 24_12_10-16_06_02
OPERATOR  : Carmen S.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-081-014-014-04 | FUSED_ID : 6359364768457875684
  IC_TEMP :  -63.82 | VDDM : 1119.31 | AUX_INT :  -10.09 | CsaBias :   59.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49806e-03 / 2
  ADC_P0  : -1.00886e-02 ± 2.61828e-02
  ADC_P1  : 8.70136e-03 ± 6.48919e-04
  ADC_P2  : -6.92756e-06 ± 3.20176e-06
  CSA_Chi2/NDF : 1.72957e-04 / 2
  CSA_P0  : 6.00714e-02 ± 8.77186e-03
  CSA_P1  : 1.03526e-02 ± 6.60896e-04
  CSA_P2  : -5.83643e-05 ± 1.00647e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4485', '1.800', '0.1638', '1.800', '0.0940', '7.000', '0.7065', 1, 1, 1, 1, 1733843162.1375294]
VI_after__Init : ['1.202', '0.4501', '1.800', '0.1648', '1.800', '0.0887', '7.000', '0.7067', 1, 1, 1, 1, 1733843170.2548664]
VI_at__the_End : ['1.201', '0.4736', '1.800', '0.1371', '1.804', '0.1113', '7.000', '0.7072', 1, 1, 1, 1, 1733843235.9119892]