DTL-STS tests database

Link to ladder: L5UR001156

Module [ Site: KIT] versions: M5UR0B3011563B2 | QR pdf

Tests:

Thermal test

2025-08-04 11:03

Lady CollazoSanchez

FEB_A: 3097 FEB_A: 3097 FEB_B: 4097

Thermally Tested in Hk.Hl.

Tested Uplinks in Hk.Hl.

-- Last status: 2026-03-30 10:49 [ Tested Ch Cl.Ro. ]

Desired grade: C

Link to Sensor: 09384 (Grade: A) -- size: 62x124 mm

Link to Heck Halle Module Test Page

History of statuses:

2026-03-30 10:49:00 { Oleksandr Suddia } [ Tested Ch Cl.Ro. ] GSI
2026-03-16 13:30:00 { Christian Schmidt } [ Undef. status at Hk.Hl. ]
2026-02-16 20:31:18 { Anju Sharma } [ Tested Uplinks ] GSI
2025-10-07 11:06:00 { Anju Sharma } [ Tested in Hk.Hl. ] GSI
2025-08-04 11:03:00 { Lady CollazoSanchez } [ Reserved ] GSI
2025-02-24 10:45:00 { Johann Heuser } [ Test started in Hk.Hl. ] GSI
2025-01-27 13:37:00 { Uli Frankenfeld } [ Undef. status at Hk.Hl. ] GSI
2025-01-14 14:24:00 { Lady CollazoSanchez } [ Test started in Hk.Hl. ] GSI
2024-12-04 15:06:00 { Henrik Herzenstiel } [ Tested Ch Cl.Ro. ] KIT
2023-11-11 10:00:00 { Irakli Keshelashvili } [ Reserved ] KIT

Comments:

2026-03-30 10:50 { Oleksandr Suddia } ( The ASIC1 was re-bonded to the sensor and tested )
2026-03-26 17:02 { Oleksandr Suddia } ( ASIC1 was replaced )
2026-03-16 13:31 { Christian Schmidt } ( On this module one chip is being replaced. It has been set to ODI-OK too early. Set back to pending )
2026-02-16 14:28 { Anju Sharma } ( ODI OK )
2025-10-07 11:14 { Anju Sharma } ( Ohmic behaviour )
2025-08-12 11:05 { Lady CollazoSanchez } ( 74 broken channels (5 on p-side and 67 on n-side). 62 of the n-side broken channels are located in the ASIC HW 6 )
2025-02-24 10:47 { Johann Heuser } ( IV grade C still acceptable. Thus to be used. )

Workflow

WF_2025_01_09_08_34_47.pdf WF_2025_10_22_10_07_26.pdf

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