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DIRC technology

R&D department

  • DIRC
    • Overview
    • Cherenkov radiation
    • DIRC
    • Experiments
    • Ch. angle calculator
    • Material properties
    • Other
  • PANDA barrel DIRC
    • Overview
    • Baseline design
    • Design options
    • Focusing system
    • Photon yield
    • Time spectrum
    • PID
    • Other
  • Prototype
    • Overview
    • MCP layout
    • Photon yield
    • Hit pattern
    • Time spectrum
    • Calibration
    • SPR
    • PID
    • Beam J14
    • Beam A14
    • Beam M15
    • Beam J15
    • Beam O16
    • Beam A17
    • DIRC@EIC
    • DIRC@GlueX
    • Other
  • Gallery
  • Contact

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Overview

Baseline design

  • hit pattern for 2x4 layout
  • maps of nph and spr

Design options

  • Eljen vs. Cargille
  • LHS lens scan
  • performance map for 2x4 layout
  • performance map for 3LC
  • Performance of different desings
  • sep power vs mcp type
  • spr nph
  • theta phi map

Focusing system

  • LHS lens scan corrected

Photon yield

  • mcp multiplicity for BD

Time spectrum

PID

  • LH separation plots
  • PID of event-based simulation. Barrel DIRC
  • PID of event-based vs. time-based
  • PID of time-based simulation0. Barrel DIRC
  • separation map
  • separation map TIR
  • separation map TIR L0
  • separation map TIR L6
  • sep power vs. time res
  • time-based pid

Other

  • Bar box support
  • bar imperfections
  • chamfer size
  • charge dependent timing
  • hit loss for plate
  • Hit loss for time-based sim
  • hit pattern prism
  • radiation length
  • separation vs track resolution
  • time-based simulation
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