Skip to main content
DIRC technology

R&D department

  • DIRC
    • Overview
    • Cherenkov radiation
    • DIRC
    • Experiments
    • Ch. angle calculator
    • Material properties
    • Other
  • PANDA barrel DIRC
    • Overview
    • Baseline design
    • Design options
    • Focusing system
    • Photon yield
    • Time spectrum
    • PID
    • Other
  • Prototype
    • Overview
    • MCP layout
    • Photon yield
    • Hit pattern
    • Time spectrum
    • Calibration
    • SPR
    • PID
    • Beam J14
    • Beam A14
    • Beam M15
    • Beam J15
    • Beam O16
    • Beam A17
    • DIRC@EIC
    • DIRC@GlueX
    • DIRC@Torch
    • Other
  • Gallery
  • Contact

Search form

Overview

Baseline design

  • hit pattern for 2x4 layout
  • maps of nph and spr

Design options

  • Eljen vs. Cargille
  • LHS lens scan
  • performance map for 2x4 layout
  • performance map for 3LC
  • Performance of different desings
  • sep power vs mcp type
  • spr nph
  • theta phi map

Focusing system

  • LHS lens scan corrected

Photon yield

  • mcp multiplicity for BD

Time spectrum

PID

  • LH separation plots
  • PID of event-based simulation. Barrel DIRC
  • PID of event-based vs. time-based
  • PID of time-based simulation0. Barrel DIRC
  • separation map
  • separation map TIR
  • separation map TIR L0
  • separation map TIR L6
  • sep power vs. time res
  • time-based pid

Other

  • Bar box support
  • bar imperfections
  • chamfer size
  • charge dependent timing
  • hit loss for plate
  • Hit loss for time-based sim
  • hit pattern prism
  • radiation length
  • separation vs track resolution
  • time-based simulation
performance map for 2x4 layout
performance map for 3LC
theta phi map
sep power vs mcp type
Eljen vs. Cargille
Performance of different desings
LHS lens scan
spr nph
site map impressum data privacy protection