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DIRC technology
R&D department
DIRC
Overview
Cherenkov radiation
DIRC
Experiments
Ch. angle calculator
Material properties
Other
PANDA barrel DIRC
Overview
Baseline design
Design options
Focusing system
Photon yield
Time spectrum
PID
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Prototype
Overview
MCP layout
Photon yield
Hit pattern
Time spectrum
Calibration
SPR
PID
Beam J14
Beam A14
Beam M15
Beam J15
Beam O16
Beam A17
DIRC@EIC
DIRC@GlueX
DIRC@Torch
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hit pattern for L3
Cherenkov cone position
Scan over Cherenkov phi
Angle scan 2 (beam)
Angle scan 1 (beam)
step scan. real geom L0
step scan. real geom L2
Plate, beam test geom
Plate pion@1.7 max step
Plate pion@1.7
Plate's hit pattern.
z scan of the hit pattern
Mom. vs. particle
Without MCPs
Pattern vs. path
Pattern vs. reflections in prism
Monochromatic Cherenkov