Skip to main content
DIRC technology
R&D department
DIRC
Overview
Cherenkov radiation
DIRC
Experiments
Ch. angle calculator
Material properties
Other
PANDA barrel DIRC
Overview
Baseline design
Design options
Focusing system
Photon yield
Time spectrum
PID
Other
Prototype
Overview
MCP layout
Photon yield
Hit pattern
Time spectrum
Calibration
SPR
PID
Beam J14
Beam A14
Beam M15
Beam J15
Beam O16
Beam A17
DIRC@EIC
DIRC@GlueX
DIRC@Torch
Other
Gallery
Contact
Search form
Search
TOF PID 17
momentum scan A17
plate vs bar for 3LC
x scan
mcp multiplicity
tir separation vs tof cut
prism-lens step scan
sep power vs nph
beam direction scan
minimization parameters
pion-proton mult ratio
le match: sim vs. data
angle match for 50 deg
tof2 walk correction
le offset
A17 plots
geant visualization
time resolution A17
walk correction A17
A17 data info
PY: grease vs air
separation vs phi
hit pattern plate A17
hit pattern bar A17
dark counts 17
quantum efficiency 17