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DIRC technology
R&D department
DIRC
Overview
Cherenkov radiation
DIRC
Experiments
Ch. angle calculator
Material properties
Other
PANDA barrel DIRC
Overview
Baseline design
Design options
Focusing system
Photon yield
Time spectrum
PID
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Prototype
Overview
MCP layout
Photon yield
Hit pattern
Time spectrum
Calibration
SPR
PID
Beam J14
Beam A14
Beam M15
Beam J15
Beam O16
Beam A17
DIRC@EIC
DIRC@GlueX
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TOF PID 17
momentum scan A17
plate vs bar for 3LC
x scan
mcp multiplicity
tir separation vs tof cut
prism-lens step scan
sep power vs nph
beam direction scan
minimization parameters
pion-proton mult ratio
le match: sim vs. data
angle match for 50 deg
tof2 walk correction
le offset
A17 plots
geant visualization
time resolution A17
walk correction A17
A17 data info
PY: grease vs air
separation vs phi
hit pattern plate A17
hit pattern bar A17
dark counts 17
quantum efficiency 17