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DIRC technology

R&D department

DIRC
PANDA barrel DIRC
Prototype
- Overview
- MCP layout
- Photon yield
- Hit pattern
- Time spectrum
- Calibration
- SPR
- PID
- Beam J14
- Beam A14
- Beam M15
- Beam J15
- Beam O16
- Beam A17
- DIRC@EIC
- DIRC@GlueX
- Other
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Overview

Baseline design

hit pattern for 2x4 layout
maps of nph and spr

Design options

Eljen vs. Cargille
LHS lens scan
performance map for 2x4 layout
performance map for 3LC
Performance of different desings
sep power vs mcp type
spr nph
theta phi map

Focusing system

LHS lens scan corrected

Photon yield

mcp multiplicity for BD

Time spectrum

PID

LH separation plots
PID of event-based simulation. Barrel DIRC
PID of event-based vs. time-based
PID of time-based simulation0. Barrel DIRC
separation map
separation map TIR
separation map TIR L0
separation map TIR L6
sep power vs. time res
time-based pid

Other

Bar box support
bar imperfections
chamfer size
charge dependent timing
hit loss for plate
Hit loss for time-based sim
hit pattern prism
radiation length
separation vs track resolution
time-based simulation

separation vs track resolution

Likelihood separation as a function of track smearing.

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