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DIRC technology

R&D department

DIRC
PANDA barrel DIRC
Prototype
- Overview
- MCP layout
- Photon yield
- Hit pattern
- Time spectrum
- Calibration
- SPR
- PID
- Beam J14
- Beam A14
- Beam M15
- Beam J15
- Beam O16
- Beam A17
- DIRC@EIC
- DIRC@GlueX
- Other
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Overview

First steps
geant geometryX 2014
Hld analysis workflow
prt layout 2015
Software installation

MCP layout

1.5 pixel shift
2.5 pixel shift
2.5 pixel shift L1
2.5 pixel shift L2
Mcp layout optimization 2015

Photon yield

mcp-prism airgap
Photons from Deltas
Photon yield
Photon yield. Plate
Photon yield. Proton

Hit pattern

Angle scan 1 (beam)
Angle scan 2 (beam)
Cherenkov cone position
hit pattern for L3
Mom. vs. particle
Monochromatic Cherenkov
Pattern vs. path
Pattern vs. reflections in prism
Plate, beam test geom
Plate pion@1.7
Plate pion@1.7 max step
Plate's hit pattern.
Scan over Cherenkov phi
step scan. real geom L0
step scan. real geom L2
Without MCPs
z scan of the hit pattern

Time spectrum

Calibration spectrum. 50mm
PiLas data 14.07.14
PiLas data 14.07.14 dch1952
PiLas + prelim. corrections
Time map 33
TOT double structure
z scan of the time

Calibration

best trigger search
Calib. curves. Beam+Pilas
Calib. of the fine time. Pilas
Calibration of the fine time 0
Calibration prism
Calibration spectrum. 75mm
Walk corr. table

SPR

SPR decomposition
SPR prj. vs. angle
SPR prj. vs. angle. 2012
SPR vs. angle
SPR vs. pixel size

PID

lh sep. for time imaging
time imaging j15

Beam J14

HP vs. beam width
HP vs tilt of dirc
J14 corrected time
J14 data info
J14 hit patterns.
step scan

Beam A14

Beam M15

debug info may15
Fine time catibration 2015
LE TE map
sim of hit pattern M15

Beam J15

Beam O16

9MCP without shift
9 vs 12 mcp
c angle fit o16
hit pattern o16
LE vs run time
mirror reflectivity
multiplicity CERN16
offset scan 100V
offset scan 150V
offset scan 200V
offset scan 50V
pdfs for S208
pdfs for S208 TOF1
pdfs for S209
photon yield o16
photon yield o16 plate
sep power o16
sep power vs. beam prof
simulations of pdf
single event HP
statistic scan for pdf
TOF1 walk
TOT vs LE S17
TOT vs LE S17 with corr

Beam A17

A17 data info
A17 plots
angle match for 50 deg
beam direction scan
dark counts 17
geant visualization
hit pattern bar A17
hit pattern plate A17
le match: sim vs. data
le offset
mcp multiplicity
minimization parameters
momentum scan A17
pion-proton mult ratio
plate vs bar for 3LC
prism-lens step scan
PY: grease vs air
quantum efficiency 17
separation vs phi
sep power vs nph
time resolution A17
tir separation vs tof cut
tof2 walk correction
TOF PID 17
walk correction A17
x scan

DIRC@EIC

DIRC@GlueX

Other

reco cuts 2

Effect of the delta time and chereckov angle selection on photon yield.

GlueX commissioning data

site map impressum data privacy protection