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DIRC technology
R&D department
DIRC
Overview
Cherenkov radiation
DIRC
Experiments
Ch. angle calculator
Material properties
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PANDA barrel DIRC
Overview
Baseline design
Design options
Focusing system
Photon yield
Time spectrum
PID
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Prototype
Overview
MCP layout
Photon yield
Hit pattern
Time spectrum
Calibration
SPR
PID
Beam J14
Beam A14
Beam M15
Beam J15
Beam O16
Beam A17
DIRC@EIC
DIRC@GlueX
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path length
DIRC@EIC prototype sim
sep vs tracking resolution
incident angle
analytical pdf from lut
time difference
Cherenkov ring fit
track correction
lut improvements
qe comparison
fast pid
reco cuts 2
reco cuts
first beam hit pattern
yield vs intensity and threshold
yield vs pilas intensity 2
geometrical reconstruction j18
beam direction scan j18
cookie vs. grease
offset scan 01.07.18
edd
yield vs pilas intensity
TOF PID 17
momentum scan A17
plate vs bar for 3LC
separation vs. track res
focal plane of RMI lens
x scan
mcp multiplicity
pi/K sep power (updated)
radii scan for pbf2
pion/kaon sep power
tir separation vs tof cut
prism-lens step scan
geometrical reco for gluex
sep power vs nph
hit pattern
beam direction scan
minimization parameters
transport efficiency
pion-proton mult ratio
le match: sim vs. data
angle match for 50 deg
tof2 walk correction
le offset
A17 plots
geant visualization
time resolution A17
walk correction A17
hitpatterns with hdgeant4
A17 data info
PY: grease vs air
separation vs phi
hit pattern plate A17
hit pattern bar A17
dark counts 17
quantum efficiency 17
hit pattern vs theta-phi
mcp layouts for 2017
lens 2 vs. lens 6 RMI
radii scan for 3LC 5 mm
lens thickness
radii scan for 3LCL with cut
3-layer lens designs
statistic scan for pdf
radii scan for 3-layer cyl lens
single event HP
angle match for 112 deg
sep power vs. beam prof
sep power o16
multiplicity CERN16
focal plane L3 jlab
LE vs run time
TOF1 walk
TOT vs LE S17 with corr
TOT vs LE S17
pdfs for S209
pdfs for S208 TOF1
pdfs for S208
offset scan 200V
offset scan 150V
offset scan 100V
offset scan 50V
simulations of pdf
offset scan 18.10.16
event by event
pico time resolution
laser data o16
mirror reflectivity
scan of mcp12
time diff vs ctheta cut
SPR vs time diff. cut
9MCP without shift
9 vs 12 mcp
photon yield o16 plate
signal shape SEQ 1
photon yield o16
c angle fit o16
hit pattern o16
signal shape STD (updated)
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